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Point Defects in Semiconductors II Experimental Aspects
Author
Title
Point Defects in Semiconductors II [electronic resource] : Experimental Aspects / by Jacques Bourgoin, Michel Lannoo.
ISBN
9783642818325
Published
Berlin, Heidelberg : Springer Berlin Heidelberg, 1983.
Physical Description
1 online resource.
Local Notes
Access is available to the Yale community.
Access and use
Access restricted by licensing agreement.
Variant and related titles
Springer ebooks.
Other formats
Printed edition:
Format
Books / Online
Language
English
Added to Catalog
February 05, 2013
Series
Springer Series in Solid-State Sciences, 35
Subjects
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