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Diffraction Analysis of the Microstructure of Materials
Title
Diffraction Analysis of the Microstructure of Materials [electronic resource] / edited by Eric J. Mittemeijer, Paolo Scardi.
ISBN
9783662067239
Publication
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2004.
Physical Description
1 online resource (XXV, 554 p).
Local Notes
Access is available to the Yale community.
Access and use
Access restricted by licensing agreement.
Summary
Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Variant and related titles
Springer ENIN.
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Printed edition:
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Format
Books / Online
Language
English
Added to Catalog
September 12, 2018
Series
Springer Series in Materials Science, 68
Contents
1 Line Profile Analysis: A Historical Overview
2 Convolution Based Profile Fitting
3 Whole Powder Pattern Modelling: Theory and Applications
4 Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systems
5 Crystallite Size and Residual Strain/Stress Modeling in Rietveld Refinement
6 The Quantitative Determination of the Crystalline and the Amorphous Content by the Rietveld Method: Application to Glass Ceramics with Different Absorption Coefficients
7 Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials
8 A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material
9 Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave
10 Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis
11 X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions
12 Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials
13 Line Profile Fitting: The Case of fcc Crystals Containing Stacking Faults
14 Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically Elastically Anisotropic Solids; The Case of Thin Films
15 Interaction between Phases in Co-deforming Two-Phase Materials: The Role of Dislocation Arrangements
16 Grain Surface Relaxation Effects in Powder Diffraction
17 Interface Stress in Polycrystalline Materials
18 Problems Related to X-Ray Stress Analysis in Thin Films in the Presence of Gradients and Texture
19 Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers
20 Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond.
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