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Measuring agreement : models, methods, and applications

Title
Measuring agreement : models, methods, and applications / Pankaj K. Choudhary, Haikady N. Nagaraja.
ISBN
9781118078587
9781118553244
1118553241
1118078586
9781118078587
Publication
Hoboken, NJ : John Wiley & Sons, Inc., 2017.
Physical Description
1 online resource (1 volume) : illustrations.
Local Notes
Access is available to the Yale community.
Notes
Description based on print version record.
Access and use
Access restricted by licensing agreement.
Variant and related titles
O'Reilly Safari. OCLC KB.
Other formats
Print version: Choudhary, Pankaj K. (Pankaj Kumar), 1975- Measuring agreement. Hoboken, NJ : John Wiley & Sons, Inc., 2017
Format
Books / Online
Language
English
Added to Catalog
January 14, 2020
Series
Wiley series in probability and statistics.
Wiley series in probability and statistics
Bibliography
Includes bibliographical references.
Contents
Introduction
Common approaches for measuring agreement
A general approach for modeling and inference
Paired measurements data
Repeated measurements data
Heteroscedastic data
Data from multiple methods
Data with covariates
Longitudinal data
A nonparametric approach
Sample size determination
Categorical data.
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