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Microelectronics failure analysis : desk reference
Title
Microelectronics failure analysis : desk reference / edited by Richard J. Ross ; EDFAS, ASM International.
ISBN
9781613447598
1613447590
9781615037261
1615037268
9781615037261
161503725X
9781615037254
Edition
6th ed.
Published
Materials Park, Ohio : ASM International, ©2011.
Physical Description
1 online resource (xi, 660 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
"ASM International, 2011, no. 09110Z"--Page 4 of cover
Some online versions lack accompanying media packaged with the printed version.
Access and use
Access restricted by licensing agreement.
Variant and related titles
Microelectronics failure analysis desk reference
Knovel. OCLC KB.
Other formats
Print version: Microelectronics failure analysis. 6th ed. Materials Park, Ohio : ASM International, ©2011
Format
Books / Online
Language
English
Added to Catalog
October 02, 2023
Bibliography
Includes bibliographical references and indexes.
Contents
Section 1. Introduction
section 2. Failure analysis process overviews
section 3. Failure analysis topics
section 4. Fault verification and classification
section 5. Localization techniques
section 6. Deprocessing and sample preparation
section 7. Inspection
section 8. Materials analysis
section 9. Focused ion beam applications
section 10. Management and reference information.
Subjects
Genre/Form
Handbook
handbooks.
Handbooks and manuals
Handbooks and manuals.
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