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Scientific detection of fakery in art II : 20-21 September 1999, Boston, Massachusetts
Title
Scientific detection of fakery in art II : 20-21 September 1999, Boston, Massachusetts / Duane R. Chartier, Walter McCrone, Richard J. Weiss, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
ISBN
0819434442
9780819434449
Published
Bellingham, Wash. : The Society, ©2000.
Physical Description
1 online resource (v, 82 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Print version: Scientific detection of fakery in art II. Bellingham, Wash. : The Society, ©2000
Format
Books / Online
Language
English
Added to Catalog
October 04, 2023
Series
SPIE proceedings series, v. 3851
Bibliography
Includes bibliographical references and index.
Subjects
Genre/Form
Conference papers and proceedings
Also listed under
Society of Photo-Optical Instrumentation Engineers.
SPIE Digital Library.
Bookmark As
Citation
