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Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California
Title
Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California / Mahmoud Fallahi, Kurt J. Linden, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
ISBN
0819427241
9780819427243
Published
Bellingham, Wash. : SPIE, ©1998.
Physical Description
1 online resource (viii, 232 pages) : illustrations (some color)
Local Notes
Access is available to the Yale community.
Notes
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Also available in print.
Original
Format
Books / Online
Language
English
Added to Catalog
October 30, 2023
Series
Proceedings / SPIE--the International Society for Optical Engineering ; v. 3285
Bibliography
Includes bibliographical references and author index.
Subjects
Genre/Form
Conference papers and proceedings
Also listed under
Society of Photo-Optical Instrumentation Engineers.
SPIE Digital Library.
Bookmark As
Citation
