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Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA
Title
Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA / Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) [and others].
ISBN
0819445460
9780819445469
Published
Bellingham, Wash. : SPIE, ©2002.
Physical Description
1 online resource (viii, 192 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Also available in print.
Original
Format
Books / Online
Language
English
Added to Catalog
October 30, 2023
Series
SPIE proceedings series, v. 4779
Bibliography
Includes bibliographical references and author index.
Subjects
Genre/Form
Conference papers and proceedings.
Also listed under
Society of Photo-optical Instrumentation Engineers.
Boeing Company.
SPIE Digital Library.
Bookmark As
Citation
