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Test and measurement applications of optoelectronic devices : 21-22 January, 2002, San Jose, USA
Title
Test and measurement applications of optoelectronic devices : 21-22 January, 2002, San Jose, USA / Aland K. Chin [and others], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
ISBN
0819443875
9780819443878
Published
Bellingham, Wash. : SPIE, ©2002.
Physical Description
1 online resource (viii, 180 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Also available in print.
Original
Format
Books / Online
Language
English
Added to Catalog
October 30, 2023
Series
SPIE proceedings series, v. 4648
Bibliography
Includes bibliographical references and index.
Subjects
Genre/Form
Conference papers and proceedings
Also listed under
SPIE Digital Library.
Bookmark As
Citation
