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Visualization and data analysis, 2002 : 21-22 January 2002, San Jose, USA
Title
Visualization and data analysis, 2002 : 21-22 January 2002, San Jose, USA / Robert F. Erbacher [and others], chairs/editors ; sponsored by IS & T-the Society of Imaging Science and Technology, SPIE-the International Society for Optical Engineering.
ISBN
0819444057
9780819444059
Published
Bellingham, Wash. : SPIE-the International Society for Optical Engineering, ©2002.
Physical Description
1 online resource (viii, 406 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Print version: Visualization and data analysis 2002. Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©2002
Format
Books / Online
Language
English
Added to Catalog
December 04, 2023
Series
Proceedings of SPIE, SPIE--the International Society for Optical Engineering, v. 4665
Bibliography
Includes bibliographical references and index.
Subjects
Genre/Form
Conference papers and proceedings
Also listed under
IS & T--the Society for Imaging Science and Technology.
Society of Photo-Optical Instrumentation Engineers.
Bookmark As
Citation
