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Astronomical data analysis II : 27-28 August 2002, Waikoloa, Hawaii, USA

Title
Astronomical data analysis II : 27-28 August 2002, Waikoloa, Hawaii, USA / Jean-Luc Starck, Fionn D. Murtagh, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, International Commission for Optics [and others].
ISBN
0819446262
9780819446268
Published
Bellingham, Wash. : SPIE, ©2002.
Physical Description
1 online resource (ix, 464 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Also available in print.
Original
Format
Books / Online
Language
English
Added to Catalog
December 04, 2023
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 4847.
Proceedings / SPIE--the International Society for Optical Engineering ; v. 4847
Bibliography
Includes bibliographical references and author index.
Genre/Form
Conference papers and proceedings
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Citation

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