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Visualization and data analysis 2005 : 17-18 January 2005, San Jose, California, USA
Title
Visualization and data analysis 2005 : 17-18 January 2005, San Jose, California, USA / Robert F. Erbacher [and others], chairs/editors ; sponsored by SPIE--the International Society of Optical Engineering [and] IS & T-the Society for Imaging Science and Technology.
ISBN
081945642X
9780819456427
Published
Bellingham, Wash. : SPIE, ©2005.
Physical Description
1 online resource (viii, 396 pages) : illustrations (some color)
Local Notes
Access is available to the Yale community.
Notes
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Print version: Visualization and data analysis 2005. Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, ©2005
Format
Books / Online
Language
English
Added to Catalog
February 14, 2024
Series
SPIE proceedings series, vol. 5669
Proceedings of Electronic Imaging Science and Technology.
Bibliography
Includes bibliographical references and author index.
Subjects
Genre/Form
Conference papers and proceedings
Also listed under
IS & T--the Society for Imaging Science and Technology.
Society of Photo-Optical Instrumentation Engineers.
Bookmark As
Citation
