Librarian View
LEADER
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20200721071956.0
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090625s2009 xx s | eng d
020
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9783642025686
035
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(Springer)978-3-642-02567-9
100
1
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Hutchison, David.
245
1
0
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Next-Generation Applied Intelligence
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[electronic resource] :
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22nd International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2009, Tainan, Taiwan, June 24-27, 2009. Proceedings /
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edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Randy Goebel, Jörg Siekmann, Wolfgang Wahlster, Been-Chian Chien, Tzung-Pei Hong, Shyi-Ming Chen, Moonis Ali.
260
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Berlin, Heidelberg :
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Springer Berlin Heidelberg,
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2009.
490
1
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Lecture Notes in Computer Science,
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0302-9743 ;
|v
5579
506
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Access restricted by licensing agreement.
590
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Access is available to the Yale community.
650
0
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Artificial intelligence.
650
0
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Computer science.
650
0
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Computer vision.
650
0
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Data mining.
650
0
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Information Systems.
650
0
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Optical pattern recognition.
700
1
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Ali, Moonis.
700
1
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Chen, Shyi-Ming.
700
1
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Chien, Been-Chian.
700
1
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Goebel, Randy.
700
1
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Hong, Tzung-Pei.
700
1
|a
Kanade, Takeo.
700
1
|a
Kittler, Josef.
700
1
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Kleinberg, Jon M.
700
1
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Mattern, Friedemann.
700
1
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Mitchell, John C.
700
1
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Naor, Moni.
700
1
|a
Nierstrasz, Oscar.
700
1
|a
Pandu Rangan, C.
700
1
|a
Siekmann, Jörg.
700
1
|a
Steffen, Bernhard.
700
1
|a
Sudan, Madhu.
700
1
|a
Terzopoulos, Demetri.
700
1
|a
Tygar, Doug.
700
1
|a
Vardi, Moshe Y.
700
1
|a
Wahlster, Wolfgang.
700
1
|a
Weikum, Gerhard.
710
2
|a
SpringerLink (Online service)
730
0
|a
Springer eBooks.
852
8
0
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Online resource
856
4
0
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https://yale.idm.oclc.org/login?URL=http://dx.doi.org/10.1007/978-3-642-02568-6
|y
Online book
830
0
|a
Lecture notes in computer science ;
|v
5579.
902
|a
Yale Internet Resource
|b
Yale Internet Resource >> None|DELIM|9340880
905
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online resource
907
|a
2009-08-11T11:35:37.000Z
946
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DO NOT NOT EDIT. DO NOT EXPORT.
953
4
0
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http://dx.doi.org/10.1007/978-3-642-02568-6