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1.
Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Polarization and color techniques in industrial inspection : 17-18 June 1999, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Optical measurements and sensors for the process industries : [conference] 20-22 June 1994, Frankfurt, FRG
Published
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1994.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Laser micromachining for optoelectronic device fabrication : 30 October 2002, Brugge, Belgium
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Applications of optical fiber sensors : 22-24 May 2000, Glasgow, Scotland, United Kingdom
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online