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Optical pattern recognition
Subject: Is
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Optical pattern recognition

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1.
Automatic target recognition XV : 29-31 March 2005, Orlando, Florida, USA
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Optical information systems III : 3-4 August, 2005, San Diego, California, USA
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Optical pattern recognition XVI : 31 March-1 April 2005, Orlando, Florida, USA
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Signal processing, sensor fusion, and target recognition XIV : 28-30 March 2005, Orlando, Florida, USA
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Automatic target recognition XIV : 13-15 April 2004, Orlando, Florida, USA
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Optical information systems II : 4-5 August 2004, Denver, Colorado, USA
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Signal processing, sensor fusion, and target recognition XIII : 12-14 April 2004, Orlando, Florida, USA
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash. USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online