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Industrial applications

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Current results range from 1996 to 2006

1.
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Optical methods for industrial processes : 6-7 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Nanoscience using laser-solid interactions : 24-25 January 2002, San Jose, USA
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Laser technology VII. Applications of lasers : 23-27 September, 2002, Szczecin-Świnoujście, Poland
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California
Published
Bellingham, Wash. : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Wavelet applications in industrial processing : 28-29 October 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
Photonics applications in astronomy, communications, industry, and high-energy physics experiments : 23-26 May 2002, Wilga, Poland
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Machine vision applications in industrial inspection IV : 31 January-1 February, 1996, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
Machine vision applications in industrial inspection XIV : 16-17 January 2006, San Jose, California, USA
Published
Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, ©2006.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
13.
Machine vision applications in industrial inspection X : 21-22 January 2002, San Jose, [California] USA
Published
Bellingham, Wash. : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
14.
Machine vision applications in industrial inspection IX : 22-23 January 2001, San Jose, [California] USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
15.
Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
16.
Third Pacific Northwest Fiber Optic Sensor Workshop : 6-7 May 1997, Troutdale, Oregon
Author
Pacific Northwest Fiber Optic Sensor Workshop (3rd : 1997 : Troutdale, Or.)
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
17.
Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore
Author
International Symposium on Laser Precision Microfabrication (2nd : 2001 : Singapore)
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
18.
Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
19.
Applications and science of computational intelligence V : 2-3 April 2002, Orlando, USA
Published
Bellingham, Wash. : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
20.
Low-light-level and real-time imaging systems, components, and applications : 9-11 July 2002, Seattle, Washington, USA
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online