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Subject: "Mechanical engineering."
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1.
Optomechatronic systems : 5-6 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Optical methods for industrial processes : 6-7 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
In-process optical measurements : proceedings
Author
European Congress on Optics (1st : 1988 : Hamburg, Germany)
Published
Bellingham, Wash., USA : SPIE, ©1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Industrial inspection II : 12-13 March 1990, the Hague, the Netherlands
Author
European Congress on Optics (3rd : 1990 : Hague, Netherlands)
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1990.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Industrial inspection : proceedings, ECO1, 19-20 September 1988, Hamburg, Federal Republic of Germany
Published
Bellingham, Wash., U.S.A. : SPIE, 1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Sensors and controls for intelligent manufacturing : 7 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Sensors and controls for intelligent machining, agile manufacturing, and mechatronics : 4-5 November 1998, Boston, Massachusetts
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Sensors and controls for advanced manufacturing : 14-15 October 1997, Pittsburgh, Pennsylvania
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
13.
Optical online industrial process monitoring : 22 September 1999, Boston, Massachusetts
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
14.
Intelligent manufacturing : 29-30 October 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online