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System diagnosis and prognosis: security and condition monitoring issues III : 21 April, 2003, Orlando, Florida, USA
Title
System diagnosis and prognosis: security and condition monitoring issues III : 21 April, 2003, Orlando, Florida, USA / Peter K. Willett, Thiagalingam Kirubarajan, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
ISBN
0819449679
9780819449672
Published
Bellingham, Wash. : SPIE, ©2003.
Physical Description
1 online resource (v, 174 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
Previous conference entitled: Component and systems diagnostics, prognostics, and health management II.
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
Access and use
Access restricted by licensing agreement.
Variant and related titles
Component and systems diagnostics, prognostics, and health management
SPIE digital library. OCLC KB.
Other formats
Also available in print.
Original
Format
Books / Online
Language
English
Added to Catalog
October 30, 2023
Series
SPIE proceedings series ; v. 5107
Bibliography
Includes bibliographical references and author index.
Subjects
Genre/Form
Conference papers and proceedings.
Also listed under
Society of Photo-optical Instrumentation Engineers.
SPIE Digital Library.
Bookmark As
Citation
