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IEEE Computer Society
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Computer software
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1.
... ACM/IEEE ... International Conference on Model Driven Engineering Languages and Systems (MODELS)
Author
MODELS (Conference), author
Published
Piscataway, NJ : IEEE
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
2.
Proceedings of the ... International Symposium on Computational Intelligence and Design
Author
International Symposium on Computational Intelligence and Design
Published
Los Alamitos, Calif. : IEEE Computer Society
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
3.
Proceedings
Author
Testing: Academic & Industrial Conference--Practice and Research Techniques, author
Published
Los Alamitos, California. : IEEE Computer Society, 2006-2009.
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
4.
IEEE International Conference on Software Testing, Verification and Validation Workshops
Author
IEEE International Conference on Software Testing, Verification, and Validation Workshops, author
Published
Los Alamitos, California : IEEE Computer Society
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
5.
Proceedings COMPSAC ... the IEEE Computer Society's ... International Computer Software & Applications Conference
Author
COMPSAC
Published
New York, N.Y. : Institute of Electrical and Electronics Engineers, 1977-1999.
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
6.
ICSE Workshop on Model-Based Methodologies for Pervasive and Embedded Software
Author
ICSE Workshop on Model-Based Methodologies for Pervasive and Embedded Software, issuing body
Published
Piscataway, NJ : Institute of Electrical and Electronic Engineers
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
7.
... IEEE/ACM International Workshop on Search-Based Software Testing
Author
IEEE/ACM International Workshop on Search-Based Software Testing
Published
[Piscataway, NJ] : [IEEE]
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
8.
Proceedings
Author
International Software Product Line Conference
Published
Los Alamitos, Calif. : IEEE Computer Society, IEEE
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online