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Author/Creator: Is Not
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Lowell, John
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Is Is Not
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Optical methods

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Online Results (89)
1.
Optical Metrology and Inspection for Industrial Applications IV
Author
Optical Metrology and Inspection for Industrial Applications (Conference) (4th : 2016: Beijing, China)
Published
Bellingham, Washington : SPIE, [2016]
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Image Processing : Machine Vision Applications VIII : 10-11 February 2015, San Francisco, California, United States
Published
Bellingham, Washington : SPIE ; Springfield, Virginia : IS&T--The Society for Imaging Science and Technology, [2015].
©2015
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Optical measurement systems for industrial inspection IX : 22-25 June 2015, Munich, Germany
Published
Bellingham, Washington : SPIE, [2015]
©2015
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Twelfth International Conference on Quality Control by Artificial Vision : 3-5 June 2015, Le Creusot, France
Author
International Conference on Quality Control by Artificial Vision (12th : 2015 : Le Creusot, France), author
Published
Bellingham, Washington : SPIE, [2015].
©2015
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Image processing : machine vision applications VII : 3-4 February 2014, San Francisco, California, United States
Published
Bellingham, Washington : SPIE ; Springfield, Virginia : IS&T--The Society for Imaging Science and Technology, [2014]
©2014.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Optical metrology and inspection for industrial applications III : 9-11 October 2014, Beijing, China
Published
Bellingham, Washington : SPIE, [2014]
©2014
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Image processing : machine vision applications VI : 5-6 February 2013, Burlingame, California, United States
Published
Bellingham, Washington : SPIE, [2013]
©2013
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Optical measurement systems for industrial inspection VIII : 13-16 May 2013, Munich, Germany
Published
Bellingham, Washington : SPIE, [2013]
©2013
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Image processing : machine vision applications V : 25 January 2012, Burlingame, California, United States
Published
Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, ©2012.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
Optical Metrology and Inspection for Industrial Applications II : 5-7 November 2012, Beijing, China
Published
Bellingham, Wash. : SPIE, ©2012.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Image processing : machine vision applications IV : 25-27 January 2011, San Francisco, California, United States
Published
Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, ©2011.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
Optical measurement systems for industrial inspection VII : 23-26 May 2011, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2011.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
13.
Tenth International Conference on Quality Control by Artificial Vision : 28-30 June 2011, Saint-Etienne, France
Author
International Conference on Quality Control by Artificial Vision (10th : 2011 : Saint-Etienne, France)
Published
Bellingham, Wash. : SPIE, ©2011.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
14.
Image processing : machine vision applications III : 19-21 January 2010, San Jose, California, United States
Published
Bellingham, Wash. : SPIE, ©2010.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
15.
Optical metrology and inspection for industrial applications : 18-20 October 2010
Published
Bellingham, Wash. : SPIE, ©2010.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
16.
Optical inspection and metrology for non-optics industries : 3-4 August 2009, San Diego, California, United States
Published
Bellingham, Wash. : SPIE, ©2009.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
17.
Optical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany
Published
Bellingham, Wash. : SPIE, 2009.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
18.
Image processing : machine vision applications : 29-31 January 2008, San Jose, California, USA
Published
Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, 2008.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
19.
Two- and three-dimensional methods for inspection and metrology VI : 10-11 August 2008, San Diego, California, USA
Published
Bellingham, Wash. : SPIE, 2008.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
20.
Eighth International Conference on Quality Control by Artificial Vision : 23-25 May 2007, Le Creusot, France
Author
International Conference on Quality Control by Artificial Vision (8th : 2007 : Le Creusot, France)
Published
Bellingham, Wash., USA : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
21.
Machine vision applications in industrial inspection XV : 29-30 January, 2007, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
22.
Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
23.
Two- and three-dimensional methods for inspection and metrology V : 11-12 September 2007, Boston, Massachusetts, USA
Published
Bellingham, Wash. : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
24.
Machine vision applications in industrial inspection XIV : 16-17 January 2006, San Jose, California, USA
Published
Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, ©2006.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
25.
Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA
Published
Bellingham, Wash. : SPIE, ©2006.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online