Books+ Search Results

Subject with Hierarchy: Is Not Indicators (Biology)
Subject (Genre): Is Congresses
Subject: Is Measurement
Published
Chicago : University of Chicago Press, [2021]
©2021
Location
MARX LIBRARY >> HD56.25 .M4366 2021 (LC)
Format
Books
Published
Chicago : University of Chicago Press, [2021]
©2021
Location
Yale Internet Resource >> None
Format
Books / Online
Author
Rencontre aristotélicienne (7th : 2018 : Catania, Italy), author
Published
Paris : Librairie philosophique J. Vrin ; Bruxelles : Éditions Ousia, 2020.
Location
SML, Stacks, LC Classification >> B491.M4 R46 2018 (LC)
Format
Books
Published
West Conshohocken, PA : ASTM International, [2019]
Location
Yale Internet Resource >> None
Format
Books / Online
Author
International Thermal Conductivity Conference (33rd : 2017 : Logan, Utah)
Published
Lancaster, PA : DEStech Publications, 2018.
Location
Yale Internet Resource >> None
Format
Books / Online
Author
International Ural Conference on Measurements
Published
Piscataway, NJ : IEEE
Online
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
Author
Lidar Remote Sensing for Environmental Monitoring (Conference) (15th : 2016 : New Delhi, India)
Published
Bellingham, Washington, USA : SPIE, [2016]
©2016
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2016]
©2016
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2015]
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2015]
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Author
International Symposium on Optoelectronic Technology and Application 2014 (2014 : Beijing, China), author
Published
Bellingham, Washington : SPIE, [2014]
©2014
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2015]
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2015]
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, 2015.
Location
Yale Internet Resource >> None
Format
Books / Online
Author
Metrology, Inspection, and Process Control for Microlithography (Conference) (29th : 2015 : San Jose, Calif.), author
Published
Bellingham, Washington : SPIE, [2015].
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2015]
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2015]
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Author
International Conference on Sensors, Measurement and Intelligent Materials (3rd : 2014 : Zhuhai, China)
Published
Pfaffikon, Switzerland : Trans Tech Publications Ltd, 2015.
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2015].
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Author
International Conference on Optical Instruments and Technology (2015 : Beijing), author
Published
Bellingham, Washington : SPIE, [2015]
©2015
Location
Yale Internet Resource >> None
Format
Books / Online
Author
Valière, Jean-Christophe
Published
London, England ; Hoboken, New Jersey : ISTE Ltd : John Wiley & Sons, 2014.
©2014
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2014]
©2014
Location
Yale Internet Resource >> None
Format
Books / Online
Author
Ibanez, Eduardo
Published
[Golden, Colo.] : National Renewable Energy Laboratory, [2014]
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2014]
©2014
Location
Yale Internet Resource >> None
Format
Books / Online
Published
Bellingham, Washington : SPIE, [2014]
©2014
Location
Yale Internet Resource >> None
Format
Books / Online