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Online Results (55)
1.
IEEE European Test Workshop proceedings : 23-26 May, 2000, Cascais, Portugal
Author
IEEE European Test Workshop (2000 : Cascais, Portugal)
Published
Los Alamitos, Calif. : IEEE Computer Society, c2000.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
2.
International Conference on Computer Design proceedings : 17-20 October 2000, Austin, Texas
Author
IEEE International Conference on Computer Design (2000 : Austin, Tex.)
Published
Los Alamitos, Calif. : IEEE Computer Society, c2000.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
3.
Proceedings, 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems October 25-27, 2000, Yamanashi, Japan
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2000 : Yamanashi, Japan)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c2000.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
4.
International Conference on Computer Design (ICCD '99) proceedings : 10-13 October 1999, Austin, Texas
Author
IEEE International Conference on Computer Design (1999 : Austin, Tex.)
Published
Los Alamitos, Calif. : IEEE Computer Society, c1999.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
5.
Ninth Great Lakes Symposium on VLSI proceedings : Ypsilanti Marriott at Eagle Court, Ypsilanti, Michigan, March 4-6, 1999
Author
Great Lakes Symposium on VLSI (9th : 1999 : Ypsilanti, Mich.)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1999.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
6.
Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 1-3, 1999, Albuquerque, New Mexico
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 : Albuquerque, N.M.)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1999.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
7.
Proceedings, International Test Conference 1999
Author
International Test Conference (30th : 1999 : Atlantic City, N.J.)
Published
Washington, D.C. : International Test Conference ; Piscataway, NJ : IEEE Service Center, c1999.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
8.
Defect and fault tolerance in VLSI systems proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 2-4, 1998, Austin, Texas
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1998 : Austin, Tex.)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1998.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
9.
International Conference on Computer Design proceedings : VLSI in computers and processors : October 5-7, 1998, Austin, Texas
Author
IEEE International Conference on Computer Design (1998 : Austin, Tex.)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1998.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
10.
Proceedings 1998 IEEE Symposium on IC/Package Design Integration, February 2-3, 1998, Santa Cruz, California
Author
IEEE Symposium on IC/Package Design Integration (1998 : Santa Cruz, Calif.)
Published
Los Alamitos, CA : IEEE Computer Society Press, c1998.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
11.
Proceedings of the 8th Great Lakes Symposium on VLSI Hotel Acadiana, Lafayette, Louisiana, February 19-21, 1998
Author
Great Lakes Symposium on VLSI (8th : 1998 : Lafayette, La.)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1998.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
12.
Great Lakes Symposium on VLSI, proceedings, March 13-15, 1997, Urbana-Champaign, Illinois
Author
Great Lakes Symposium on VLSI (7th : 1997 : Urbana-Champaign, Ill.)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1997.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
13.
Proceedings
Author
International Symposium on Physical Design
Published
New York, N.Y. : Association for Computing Machinery,
Location
Library Shelving Facility (LSF) >> TK7874.75 I58 (LC)+ Oversize
Format
Journals & Newspapers
14.
Proceedings European Design and Test Conference : ED & TC 96, March 11-14, 1996, Paris, France
Author
European Design and Test Conference (1997 : Paris, France)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1997.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
15.
Proceedings, 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems October 20-22, 1997, Paris, France
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1997 : Paris, France)
Published
Los Alamitos : IEEE Computer Society Press, c1997.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
16.
1997 proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon, Austin, Texas, USA
Author
International Conference on Innovative Systems in Silicon (2nd : 1997 : Austin, Tex.)
Published
[New York, NY] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Additional copies from IEEE Service Center, c1997.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
17.
Formal Methods in Computer-Aided Design
Author
FMCAD (Conference), issuing body
Published
Los Alamitos, California : IEEE Computer Society
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
18.
Proceedings
Author
International Conference on Innovative Systems in Silicon
Published
[New York, N.Y.] : Institute of Electrical and Electronics Engineers, c1996-
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
19.
1996 proceedings Eighth Annual IEEE International Conference on Innovative Systems in Silicon, Austin, Texas, USA
Author
International Conference on Innovative Systems in Silicon (8th : 1996 : Austin, Tex.)
Published
[New York, NY] : Institute of Electrical and Electronics Engineers ; Piscataway, NJ : Additional copies from IEEE Service Center, c1996.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
20.
Proceedings European Design and Test Conference : ED & TC 96, March 11-14, 1996, Paris, France
Author
European Design and Test Conference (1996 : Paris, France)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1996.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
21.
Proceedings, 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems November 6-8, 1996, Boston, Massachusetts
Author
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1996 : Boston, Mass.)
Published
Los Alamitos : IEEE Computer Society Press, c1996.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
22.
Ninth International Conference on VLSI Design proceedings, January 3-6, 1996, Bangalore, India
Author
International Conference on VLSI Design (9th : 1996 : Bangalore, India)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
23.
Proceedings of the ASP-DAC'95/CHDL'95/VLSI'95 Asia and South Pacific Design Automation Conference, IFIP International Conference on Computer Hardware Description Languages and their Applications, IFIP International Conference on Very Large Scale Integration, August 29-September 1, 1995, Makuhari Messe, Chiba, Japan
Author
Asia and South Pacific Design Automation Conference (1995 : Chiba, Japan)
Published
[S.l. : IEEE], c1995.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
24.
Proceedings the European Design and Test Conference, ED & TC 1995, Paris, France, March 6-9, 1995
Author
European Design and Test Conference (1995 : Paris, France)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online
25.
Proceedings, the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana
Author
International Workshop on Defect and Fault Tolerance in VLSI Systems (1995 : Lafayette, La.)
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1995.
Online
IEEE conference proceeding
Location
Yale Internet Resource
Format
Books / Online