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1.

Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas

Published

Bellingham, Wash. : SPIE, ©1995.

Online

Location

Yale Internet Resource >> None

Format

Books / Online

2.

Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas

Published

Bellingham, Wash., USA : SPIE, ©1994.

Online

Location

Yale Internet Resource >> None

Format

Books / Online