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Lowell, John
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Online Results (2)
1.
Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, c1995.
Location
Library Shelving Facility (LSF) >> TK7871.85 O6742 1995 (LC)+ Oversize
Format
Books
2.
Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, ©1994.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online