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Semiconductors > Defects

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Online Results (2)
1.
Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan
Author
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (14th : 2011 : Miyazaki-shi, Japan)
Published
Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
©2012
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.
Published
Warrendale, Pa. : Materials Research Society, c2009.
Location
Library Shelving Facility (LSF) >> TK7871.85 .P475 2008 (LC)
Format
Books
3.
Defects in high-k gate dielectric stacks : nano-electronic semiconductor devices
Author
NATO Advanced Research Workshop on Defects in High-K Dielectric Nano-electronic Semiconductor Devices (2005 : Saint Petersburg, Russia)
Published
Dordrecht : Springer, c2006.
Location
Library Shelving Facility (LSF) >> TK7895 G36 N37 2005 (LC)
Format
Books
4.
Silicon carbide 2006--materials, processing, and devices : symposium held April 18-20, 2006, San Francisco, California, U.S.A.
Published
Warrendale, Pa. : Materials Research Society, c2006.
Location
Library Shelving Facility (LSF) >> TA418.26 .S54 2006 (LC)
Format
Books
5.
Stress-induced phenomena in metallization : seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas 14-16 June 2004
Author
International Workshop on Stress-Induced Phenomena in Metallization (7th : 2004 : Austin, Texas)
Published
Melville, N.Y. : American Institute of Physics, 2004.
Location
Library Shelving Facility (LSF) >> QC1 A48 741 (LC)
Format
Books
6.
IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP
Author
IEEE International Conference on Advanced Thermal Processing of Semiconductors
Published
Piscataway, N.J. : IEEE, ©2002-
Online
Full text
Location
Yale Internet Resource >> None
Format
Journals & Newspapers / Online
7.
Stress induced phenomena in metallization : sixth international workshop, Ithaca, New York, 25-27 July, 2002
Published
Melville, N.Y. : American Institute of Physics, 2002.
Location
Library Shelving Facility (LSF) >> QC1 A48 612 (LC)
Format
Books
8.
Si front-end processing : physics and technology of dopant-defect interactions
Published
Warrendale, Pa. : Materials Research Society, c1999-
Location
Library Shelving Facility (LSF) >> TK7871.85 S536 (LC)
Format
Journals & Newspapers
9.
Semiconductor process and device performance modeling : symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A.
Published
Warrendale, Pa. : Materials Research Society, c1998.
Location
Library Shelving Facility (LSF) >> TK7871.85 S46697X 1997 (LC)
Format
Books
10.
Stress induced phenomena in metallization : fifth international workshop, Stuttgart, Germany, June, 1999
Published
Woodbury, N.Y. : American Institute of Physics, c1999.
Location
Library Shelving Facility (LSF) >> QC1 A48 491 (LC)
Format
Books
11.
Stress induced phenomena in metallization : fourth international workshop, Tokyo, Japan, June, 1997
Published
Woodbury, N.Y. : American Institute of Physics, c1998.
Location
Library Shelving Facility (LSF) >> QC1 A48 418 (LC)
Format
Books
12.
Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A.
Published
Pittsburg, Pa. : Materials Research Society, c1997.
Location
Library Shelving Facility (LSF) >> TK7871.85 D45453X 1997 (LC)
Format
Books
13.
Defects in electronic materials II : synposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
Published
Pittsburgh, Penn : Materials Research Society, c1997.
Location
Library Shelving Facility (LSF) >> TK7871 D4X 1996 (LC)
Format
Books
14.
Defect and impurity engineered semiconductors and devices
Published
Pittsburgh, Pa. : Materials Research Society, c1995-
Location
Library Shelving Facility (LSF) >> TK7871.85 D452 (LC)
Format
Journals & Newspapers
15.
Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A.
Published
Pittsburgh, Pa. : Materials Research Society, c1994.
Location
Library Shelving Facility (LSF) >> QC611.6 D4 P48X 1994 (LC)
Format
Books
16.
Shallow impurities in semiconductors : proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors, "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 Austus 1992
Published
Zürich, Switzerland ; Brookfield, VT : Trans Tech Publications, 1993.
Location
Library Shelving Facility (LSF) >> QC611.6 D4 S53 1993 (LC)
Format
Books
17.
Defect engineering in semiconductor growth, processing, and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
Published
Pittsburgh, Pa. : Materials Research Society, c1992.
Location
Library Shelving Facility (LSF) >> QC611.6 D4 D4183X 1992 (LC)
Format
Books
18.
Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991
Published
New York : American Institute of Physics, c1992.
Location
Library Shelving Facility (LSF) >> QC1 A48 263 (LC)
Format
Books
19.
Physics and Chemistry of Mercury Cadmium Telluride and novel IR detector materials : San Francisco, CA 1990
Published
New York : American Institute of Physics, c1991.
Location
Library Shelving Facility (LSF) >> QC1 A48 235 (LC)
Format
Books
20.
Shallow impurities in semiconductors : proceedings of the fourth international conference on shallow impurities in semiconductors, King's College, London, 31 July to 2 August 1990
Published
Aedermannsdorf, Switzwerland ; Brookfield, VT, USA : Trans Tech Publications, c1991.
Location
Library Shelving Facility (LSF) >> TA401 M44 65-66 (LC)
Format
Books
21.
Point and extended defects in semiconductors
Author
Workshop on Point, Extended, and Surface Defects in Semiconductors (2nd : 1988 : Erice, Italy)
Published
New York : Plenum Press, c1989.
Location
Library Shelving Facility (LSF) >> QC611.6 D4 W67X 1988 (LC)
Format
Books
22.
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988
Author
International Conference on Defects in Semiconductors (15th : 1988 : Budapest, Hungary)
Published
Aedermannsdorf, Switzerland ; Brookfield, VT : Trans Tech Publications, c1989.
Location
Library Shelving Facility (LSF) >> TA401 M44 38-41 (LC)
Format
Books
23.
Defects and properties of semiconductors : defect engineering
Published
Tokyo : KTK Scientific ; Dordrecht ; Boston : D. Reidel ; Norwell, MA, U.S.A. : Distributed in the U.S.A. and Canada by Kluwer Academic, c1987.
Location
Library Shelving Facility (LSF) >> QC611.6 D4 D4184 1987 (LC)
Format
Books
24.
Proceedings of the 14th International Conference on Defects in Semiconductors : Paris, France, August 18-22, 1986
Author
International Conference on Defects in Semiconductors (14th : 1986 : Paris, France)
Published
Aedermannsdorf, Switzerland : Trans Tech Publications, c1986.
Location
Library Shelving Facility (LSF) >> TA401 M44 10-12 (LC)
Format
Books
25.
Defect complexes in semiconductor structures : proceedings of the international school held in Mátrafüred, Hungary, September 13-17, 1982
Published
Berlin ; New York : Springer-Verlag, 1983.
Location
Library Shelving Facility (LSF) >> QC1 L42 175
Format
Books