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Semiconductors > Defects
Subject: Is
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Reliability

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Online Results (1)
1.
Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A.
Published
Warrendale, Pa. : Materials Research Society, c2009.
Location
Library Shelving Facility (LSF) >> TK7871.85 .P475 2008 (LC)
Format
Books
2.
Physical limitations of semiconductor devices
Author
Vashchenko, V. A.
Published
New York : Springer, c2008.
Location
Library Shelving Facility (LSF) >> TK7871.85 .V37 2008 (LC)
Format
Books
3.
Electronic failure analysis handbook techniques and applications for electronic and electrical packages, components, and assemblies
Author
Martin, Perry L.
Published
New York : McGraw-Hill, [2000]
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online