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Machine vision applications in industrial inspection III : 8-9 February 1995, San Jose, California
Title
Machine vision applications in industrial inspection III : 8-9 February 1995, San Jose, California / Frederick Y. Wu, Stephen S. Wilson, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
ISBN
081941770X
9780819417701
Published
Bellingham, Wash., USA : SPIE, ©1995.
Physical Description
1 online resource (ix, 378 pages) : illustrations.
Local Notes
Access is available to the Yale community.
Notes
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2004. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Also issued in print.
Original
Format
Books / Online
Language
English
Added to Catalog
December 04, 2023
Series
Proceedings / SPIE--the International Society for Optical Engineering, v. 2423
Bibliography
Includes bibliographical references and index.
Subjects
Genre/Form
Conference papers and proceedings.
Also listed under
IS & T--the Society for Imaging Science and Technology.
Society of Photo-optical Instrumentation Engineers.
SPIE Digital Library.
Bookmark As
Citation
