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050127s1995 waua ob 101 0 eng d
035
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(OCoLC)ocm57513592
040
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SPIED
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eng
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SPIED
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OCLCQ
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OCLCF
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OCLCO
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OCLCQ
|d
OCL
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OCLCO
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COO
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OCLCQ
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VT2
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CEF
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OCLCA
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WYU
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MERER
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OCLCQ
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HS0
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UAB
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OCLCQ
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OCLCO
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SFB
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OCLCO
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OCLCQ
019
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971086137
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1044612082
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1056312115
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1065699107
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1071874550
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1075499017
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1109228470
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1127164383
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1167460940
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1256290648
020
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081941770X
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(paperback)
020
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9780819417701
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(paperback)
050
4
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TS156.2
|b
.M319 1995
245
0
0
|a
Machine vision applications in industrial inspection III :
|b
8-9 February 1995, San Jose, California /
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Frederick Y. Wu, Stephen S. Wilson, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
260
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Bellingham, Wash., USA :
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SPIE,
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©1995.
300
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1 online resource (ix, 378 pages) :
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illustrations.
336
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text
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txt
|2
rdacontent
337
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computer
|b
c
|2
rdamedia
338
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online resource
|b
cr
|2
rdacarrier
347
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text file
347
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PDF
490
1
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Proceedings / SPIE--the International Society for Optical Engineering,
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0277-786X ;
|v
v. 2423
504
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Includes bibliographical references and index.
506
|a
Access restricted by licensing agreement.
530
|a
Also issued in print.
546
|a
English.
533
|a
Electronic reproduction.
|b
Bellingham, Wash. :
|c
SPIE--the International Society for Optical Engineering,
|d
2004.
|n
Mode of access: World Wide Web.
|n
Access restricted to SPIE Digital Library subscribers.
590
|a
Access is available to the Yale community.
650
0
|a
Quality control
|x
Optical methods
|x
Automation
|v
Congresses.
650
0
|a
Computer vision
|v
Congresses.
650
0
|a
Engineering inspection
|v
Congresses.
650
4
|a
Mechanical Engineering.
650
4
|a
Engineering & Applied Sciences.
650
4
|a
Industrial & Management Engineering.
650
7
|a
Quality control
|x
Optical methods
|x
Automation.
|2
fast
|0
(OCoLC)fst01084994
655
7
|a
Conference papers and proceedings.
|2
fast
|0
(OCoLC)fst01423772
700
1
|a
Wu, Frederick Y.
700
1
|a
Wilson, Stephen S.
710
2
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IS & T--the Society for Imaging Science and Technology.
|0
http://id.loc.gov/authorities/names/n91063246
710
2
|a
Society of Photo-optical Instrumentation Engineers.
710
2
|a
SPIE Digital Library.
730
0
|a
SPIE digital library.
|g
OCLC KB.
776
1
|c
Original
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081941770X
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(OCoLC)32416872
830
0
|a
Proceedings of SPIE--the International Society for Optical Engineering ;
|v
v. 2423.
|0
http://id.loc.gov/authorities/names/n42030541
852
8
0
|b
yulint
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None
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Online resource
852
8
0
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Online resource
856
4
0
|y
Online book
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https://yale.idm.oclc.org/login?URL=http://proceedings.spiedigitallibrary.org/volume.aspx?volume=2423
901
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TS156.2
902
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Yale Internet Resource
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Yale Internet Resource >> None|DELIM|16782770
905
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online resource
907
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2023-12-04T16:19:23.000Z
946
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DO NOT EDIT. DO NOT EXPORT.
953
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http://proceedings.spiedigitallibrary.org/volume.aspx?volume=2423