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1.
Environmentally conscious manufacturing III : 29-30 October, 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Environmentally conscious manufacturing : 6-8 November, 2000, Boston, [Mass.] USA
Published
Bellingham, Wash. : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Computer-controlled microshaping : 16-18 June 1999, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Lasers in material processing and manufacturing II : 10-12 November, 2004, Beijing, China
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Laser-assisted processing II : 13-14 March 1990, the Hague, the Netherlands
Author
European Congress on Optics (3rd : 1990 : Hague, Netherlands)
Published
Bellingham, Wash., USA : SPIE, ©1990.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Lasers in material processing : 16-20 June, 1997, Munich, FRG
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Optical microlithography XVII : 24-27 February 2004, Santa Clara, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Optical microlithography XI : 25-27 February, 1998, Santa Clara, California
Published
Bellingham, Wash. : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Optical microlithography X : 12-14 March, 1997, Santa Clara, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
MEMS components and applications for industry, automobiles, aerospace, and communication : 22-23 October 2001, San Francisco, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Laser-assisted microtechnology 2000 : 23-25 August 2000, St. Petersburg-Pushkin, Russia
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing II : 23-24 September, 1998, Santa Clara, California
Published
Bellingham, Wash. : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
13.
Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore
Author
International Symposium on Laser Precision Microfabrication (2nd : 2001 : Singapore)
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
14.
Process control and diagnostics : 18-19 September 2000, Santa Clara, USA
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
15.
Process, equipment, and materials control in integrated circuit manufacturing : 25-26 October 1995, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
16.
Optical methods for industrial processes : 6-7 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
17.
Process control and inspection for industry : 8-10 November 2000, Beijing, China
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
18.
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
19.
Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
20.
In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
21.
Process module metrology, control, and clustering : 11-13 September 1991, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1992.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
22.
Intelligent systems in design and manufacturing V : 25-26 October, 2005, Philadelphia, Pennsylvania, 2004
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
23.
Intelligent systems in design and manufacturing IV : 29-30 October, 2001, Newton [Massachusetts] USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
24.
Intelligent systems in design and manufacturing II : 21-22 September 1999, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
25.
Intelligent systems in design and manufacturing III : 6-8 November 2000, Boston, USA
Published
Bellingham, Wash. : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online