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26.
First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan
Author
International Symposium on High-Power Laser Macroprocessing (1st : 2002 : Osaka, Japan)
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
27.
Commercial applications of precision manufacturing at the sub-micron level : proceedings : 19-21 November 1991, London, United Kingdom
Published
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, ©1992.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
28.
Open architecture control systems and standards : 20-21 November, 1996, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
29.
Process control and diagnostics : 18-19 September 2000, Santa Clara, USA
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
30.
Process, equipment, and materials control in integrated circuit manufacturing : 25-26 October 1995, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
31.
Optical methods for industrial processes : 6-7 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
32.
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing : 1-2 October 1997, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
33.
Process control and inspection for industry : 8-10 November 2000, Beijing, China
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
34.
Plug and play software for agile manufacturing : 18-19 November, 1996, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
35.
Environmentally conscious manufacturing V : 23-24 October, 2005, Boston, Massachusetts, USA
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
36.
Environmentally conscious manufacturing IV : 26-27 October 2004, Philadelphia, Pennsylvania, USA
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
37.
Rapid prototyping and flexible manufacturing : 16 June 1997, Munich, FRG
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
38.
Intelligent systems in design and manufacturing VI : 24-26 October 2005, Boston, Massachusetts, 2005
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
39.
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
40.
Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
41.
Sensors and controls for advanced manufacturing : 14-15 October 1997, Pittsburgh, Pennsylvania
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
42.
In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
43.
Intelligent systems in design and manufacturing : 2-4 November 1998, Boston, Massachusetts
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
44.
Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
45.
In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK
Published
Bellingham, Wash. : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
46.
Intelligent manufacturing : 29-30 October 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
47.
Process module metrology, control, and clustering : 11-13 September 1991, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1992.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
48.
International Conference on Manufacturing Automation : 10-12 August 1992, Hong Kong
Author
International Conference on Manufacturing Automation (1992 : Hong Kong)
Published
Bellingham, Wash., USA : SPIE, ©1993.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
49.
Intelligent systems in design and manufacturing V : 25-26 October, 2005, Philadelphia, Pennsylvania, 2004
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
50.
Intelligent systems in design and manufacturing IV : 29-30 October, 2001, Newton [Massachusetts] USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online