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Subject: "Manufacturing processes"
Author/Creator: Is
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Society of Photo-Optical Instrumentation Engineers
Subject: Is
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Design and construction

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1.
MEMS components and applications for industry, automobiles, aerospace, and communication II : 28-29 January 2003, San Jose, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing : 1-2 October 1997, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Laser applications in microelectronic and optoelectronic manufacturing II : 10-12 February, 1997, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK
Published
Bellingham, Wash. : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Laser applications in microelectronic and optoelectronic manufacturing V : 24-26 January, 2000, San Jose, USA
Published
Bellingham, Wash. : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online