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1.
Machine vision applications in industrial inspection V : 10-11 February, 1997, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Laser applications in combustion and combustion diagnostics II : 25-26 January 1994, Los Angeles, California
Published
Bellingham, Wash., USA : SPIE, ©1994.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Laser applications in combustion and combustion diagnostics : 19-20 January 1993, Los Angeles, California
Published
Bellingham, Wash., USA : SPIE, ©1993.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Industrial vision metrology : proceedings : 11-12 July 1991, Winnipeg, Manitoba (Canada)
Published
Bellingham, Wash. : SPIE, ©1991.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Optical thin films V : new developments : 30 July-1 August 1997, San Diego, California
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Sensor fusion and decentralized control in robotic systems : 2-3 November 1998, Boston, Massachusetts
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
Industrial and highway sensors technology : 28-30 October 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Optical methods for industrial processes : 6-7 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
13.
Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
14.
Optomechatronic systems : 5-6 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
15.
Semiconductor optoelectronic device manufacturing and applications : 7-9 November 2001, Nanjing, China
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
16.
Industrial inspection II : 12-13 March 1990, the Hague, the Netherlands
Author
European Congress on Optics (3rd : 1990 : Hague, Netherlands)
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1990.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
17.
Industrial inspection : proceedings, ECO1, 19-20 September 1988, Hamburg, Federal Republic of Germany
Published
Bellingham, Wash., U.S.A. : SPIE, 1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
18.
Laser applications in microelectronic and optoelectronic manufacturing II : 10-12 February, 1997, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
19.
Sensors and controls for intelligent manufacturing : 7 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
20.
Sensors and controls for intelligent machining, agile manufacturing, and mechatronics : 4-5 November 1998, Boston, Massachusetts
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
21.
Sensors, cameras, and systems for scientific/industrial applications VIII : 30 January-1 February, 2007, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
22.
Three-dimensional and unconventional imaging for industrial inspection and metrology : 23-25 October 1995, Philadelphia, Pennsylvania
Published
Bellingham, Wash., USA : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
23.
Nanoscience using laser-solid interactions : 24-25 January 2002, San Jose, USA
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
24.
Laser technology VII. Progress in lasers : 23-27 September, 2002, Szczecin-Świnoujście, Poland
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
25.
Laser technology VII. Applications of lasers : 23-27 September, 2002, Szczecin-Świnoujście, Poland
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
26.
Laser technology VI. Applications : 27 September-1 October, 1999, Szczecin-Świnoujście, Poland
Published
Bellingham, Wash. : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
27.
Laser technology V. Applications in materials sciences and engineering : 23-27 September, 1996, Szczecin-Świnoujście, Poland
Published
Bellingham, Wash. : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
28.
Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
29.
Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
30.
Sensors and controls for advanced manufacturing : 14-15 October 1997, Pittsburgh, Pennsylvania
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
31.
In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
32.
In-process optical measurements and industrial methods : 14-15 March 1990, the Hague, the Netherlands : proceedings, ECO3, the congress of EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical Engineering
Published
Bellingham, Wash., USA : SPIE, ©1990.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
33.
Polarization and color techniques in industrial inspection : 17-18 June 1999, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
34.
Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California
Published
Bellingham, Wash. : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
35.
Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
36.
Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
37.
Optical online industrial process monitoring : 22 September 1999, Boston, Massachusetts
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
38.
Emerging lithographic technologies : 10-11 March 1997, Santa Clara, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
39.
Laser applications in microelectronic and optoelectronic manufacturing V : 24-26 January, 2000, San Jose, USA
Published
Bellingham, Wash. : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
40.
Industrial Laser Applications Symposium (ILAS 2015) : 17-18 March 2015, Kenilworth, United Kingdom
Published
Bellingham, Washington : SPIE, [2015]
©2015
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
41.
Machine vision applications in industrial inspection XV : 29-30 January, 2007, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
42.
Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
43.
Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
44.
Machine vision applications in industrial inspection XI : 22-24 January, 2003, Santa Clara, California, USA
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
45.
Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France
Published
Bellingham, Wash. : SPIE--International Society for Optical Engineering, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
46.
Wavelet applications in industrial processing : 28-29 October 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
47.
Photonics applications in astronomy, communications, industry, and high-energy physics experiments : 23-26 May 2002, Wilga, Poland
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
48.
Automated optical inspection for industry : 6-7 November 1996, Beijing, China
Published
Bellingham, Wash. : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
49.
Optical measurements and sensors for the process industries : [conference] 20-22 June 1994, Frankfurt, FRG
Published
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1994.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
50.
Videometrics II : 9-10 September 1993, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1993.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
51.
Intelligent manufacturing : 29-30 October 2003, Providence, Rhode Island, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
52.
Semiconductor lasers and applications : 15-17 October 2002, Shanghai, China
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
53.
Computational intelligence in industrial application : proceedings of the 2014 Pacific-Asia Workshop on Computer Science in Industrial Application (CIIA, December 8-9, 2014, Singapore)
Author
Pacific-Asia Workshop on Computational Intelligence in Industrial Application (2014 : Singapore) author
Published
Leiden, the Netherlands : CRC Press/Balkema, [2015]
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
54.
Industrial sensing systems : 5-6 November 2000, Boston, USA
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
55.
Optical Metrology and Inspection for Industrial Applications IV
Author
Optical Metrology and Inspection for Industrial Applications (Conference) (4th : 2016: Beijing, China)
Published
Bellingham, Washington : SPIE, [2016]
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
56.
Lasers in material processing and manufacturing III : 12-14 November 2007, Beijing, China
Published
Bellingham, Wash. : SPIE, ©2008.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
57.
Fourth International Conference on Virtual Reality and Its Applications in Industry : 23-25 October 2003, Tianjin, China
Author
International Conference on Virtual Reality and Its Applications in Industry (4th : 2003 : Tianjin, China)
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
58.
Third International Conference on Virtual Reality and Its Application in Industry : 9-12 April 2002, Hangzhou, China
Author
International Conference on Virtual Reality and Its Application in Industry (3rd : 2002 : Hangzhou, China)
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
59.
Laser assisted processing : ECO1, 19-20 September 1988, Hamburg, Federal Republic of Germany : proceedings
Published
Bellingham, Wash. : SPIE, ©1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
60.
Photonics applications in astronomy, communications, industry, and high-energy physics experiments, 2006 : 29 May-4 June, 2006, Wilga, Poland
Published
Bellingham, Wash. : SPIE, ©2006.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
61.
Laser interferometry IX : applications : 22-23 July 1998, San Diego, California
Published
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
62.
Laser interferometry IX : techniques and analysis : 20-21 July 1998, San Diego, California
Published
Bellingham, Wash. : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
63.
Excimer lasers, optics, and applications : 12-13 February 1997, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
64.
Machine vision applications, architectures, and systems integration IV : 23-24 October, 1995, Philadelphia, Pennsylvania
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
65.
Scientific and engineering applications of commercial laser devices
Published
Bellingham, Wash. USA : SPIE--the International Society for Optical Engineering, ©1986.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
66.
Machine vision applications in industrial inspection IV : 31 January-1 February, 1996, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
67.
Optical devices and diagnostics in materials science : 1-4 August 2000, San Diego, USA
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
68.
Machine vision applications in industrial inspection XIV : 16-17 January 2006, San Jose, California, USA
Published
Bellingham, Wash. : SPIE ; Springfield, Va. : IS & T, ©2006.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
69.
Advanced wavefront control : methods, devices and applications : 6-7 August 2003, San Diego, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
70.
Machine vision applications in industrial inspection X : 21-22 January 2002, San Jose, [California] USA
Published
Bellingham, Wash. : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
71.
Data mining and applications : 23-24 October 2001, Wuhan, China
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
72.
Machine vision applications in industrial inspection IX : 22-23 January 2001, San Jose, [California] USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
73.
Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
74.
Sixth Pacific Northwest Fiber Optic Sensor Workshop : 14-15 May 2003, Troutdale, Oregon, USA
Author
Pacific Northwest Fiber Optic Sensor Workshop (6th : 2003 : Troutdale, Or.)
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
75.
Fourth Pacific Northwest Fiber Optic Sensor Workshop : 6-7 May 1998, Troutdale, Oregon
Author
Pacific Northwest Fiber Optic Sensor Workshop (4th : 1998 : Troutdale, Or.)
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
76.
Third Pacific Northwest Fiber Optic Sensor Workshop : 6-7 May 1997, Troutdale, Oregon
Author
Pacific Northwest Fiber Optic Sensor Workshop (3rd : 1997 : Troutdale, Or.)
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
77.
Vision systems--applications : 13 June 1996, Besançon, France
Published
Bellingham, Wash. : SPIE--the International Society for Optical Engineering, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
78.
Laser micromachining for optoelectronic device fabrication : 30 October 2002, Brugge, Belgium
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
79.
Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan
Author
International Symposium on Laser Precision Microfabrication (3rd : 2002 : Osaka, Japan)
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
80.
Second International Symposium on Laser Precision Microfabrication : 16-18 May 2001, Singapore
Author
International Symposium on Laser Precision Microfabrication (2nd : 2001 : Singapore)
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
81.
First International Symposium on Laser Precision Microfabrication : 14-16 June 2000, Omiya, Saitama, Japan
Author
International Symposium on Laser Precision Microfabrication (1st : 2000 : Ōmiya-shi, Japan)
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
82.
Laser technology V. Physics and research and development trends : 23-27 September, 1996, Szczecin-Świnoujście, Poland
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
83.
First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan
Author
International Symposium on High-Power Laser Macroprocessing (1st : 2002 : Osaka, Japan)
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
84.
Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
85.
Applications of optical fiber sensors : 22-24 May 2000, Glasgow, Scotland, United Kingdom
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
86.
Applications and science of computational intelligence V : 2-3 April 2002, Orlando, USA
Published
Bellingham, Wash. : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
87.
Commercial applications of ultrafast lasers : 29-30 January 1998
Published
Bellingham, Wash., USA : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
88.
Commercial and biomedical applications of ultrafast lasers VII : 21-24 January 2007, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
89.
Commercial and biomedical applications of ultrafast lasers : 28-29 January 1999, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
90.
Instruments for optics and optoelectronic inspection and control : 8-10 November 2000, Beijing, China
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
91.
Optical metrology and inspection for industrial applications : 18-20 October 2010
Published
Bellingham, Wash. : SPIE, ©2010.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
92.
High-power lasers in manufacturing : 1-5 November 1999, Osaka, Japan
Published
Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
93.
Nonlinear materials, devices, and applications : 24-25 January 2000, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
94.
Organic holographic materials and applications : 7-8 August 2003, San Diego, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
95.
Commercial and biomedical applications of ultrafast and free-electron lasers : 23-24 January 2002, San Jose, USA
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
96.
Intelligent computing : theory and applications II : 12-13 April 2004, Orlando, Florida, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
97.
Low-light-level and real-time imaging systems, components, and applications : 9-11 July 2002, Seattle, Washington, USA
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
98.
Wave optics and VLSI photonic devices for information processing : 2-3 August 2001, San Diego, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
99.
Optical metrology roadmap for the semiconductor, optical, and data storage industries : 30-31 July 2000, San Diego, USA
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
100.
Mathematical modeling, estimation, and imaging : 31 July-1 August 2000, San Diego, USA
Published
Bellingham, Wash., USA : SPIE, ©2000.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online