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1.
Automated inspection and high-speed vision architectures III : 6-7 November 1989, Philadelphia, Pennsylvania
Published
Bellingham, Wash., USA : SPIE, ©1990.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Automatic optical inspection : 15-18 April 1986, Innsbruck, Austria
Published
Bellingham, Wash., USA : SPIE, ©1986.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Machine vision applications in industrial inspection III : 8-9 February 1995, San Jose, California
Published
Bellingham, Wash., USA : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
In-process optical measurements : proceedings
Author
European Congress on Optics (1st : 1988 : Hamburg, Germany)
Published
Bellingham, Wash., USA : SPIE, ©1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Industrial inspection II : 12-13 March 1990, the Hague, the Netherlands
Author
European Congress on Optics (3rd : 1990 : Hague, Netherlands)
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1990.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Industrial inspection : proceedings, ECO1, 19-20 September 1988, Hamburg, Federal Republic of Germany
Published
Bellingham, Wash., U.S.A. : SPIE, 1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Machine vision applications in industrial inspection V : 10-11 February, 1997, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Polarization and color techniques in industrial inspection : 17-18 June 1999, Munich, Germany
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online