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1.
Lithographic and micromachining techniques for optical component fabrication : 29-30 July 2001, San Diego, USA
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1998.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
Indo-Russian Workshop on Micromechanical Systems : 2-4 February 1999, New Delhi, India
Author
Indo-Russian Workshop on Micromechanical Systems (1999 : New Delhi, India)
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Advanced processing and characterization of semiconductors III : 22-24 January 1986, Los Angeles, California
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1986.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Passive components and fiber-based devices : 9-11 November, 2004, Beijing, China
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Current developments in optical engineering and commercial optics : 7, 10-11 August 1989, San Diego, California
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Contemporary optical instrument design, fabrication, and testing
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1986.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK
Published
Bellingham, Wash. : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Optoelectronic interconnects, integrated circuits, and packaging : 22-25 January 2002, San Jose, USA
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
Optical design methods, applications, and large optics : ECO1, 19-21 September 1988, Hamburg, Federal Republic of Germany
Author
European Congress on Optics (1st : 1988 : Hamburg, Germany)
Published
Bellingham, Wash., USA : SPIE--International Society for Optical Engineering, ©1989.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
13.
MOEMS display and imaging systems : 28-29 January 2003, San Jose, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
14.
Integrated optics and photonic integrated circuits : 27-29 April 2004, Strasbourg, France
Published
Bellingham, Wash. : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
15.
Optical design and testing : 15-18 October, 2002, Shanghai, China
Published
Bellingham, Wash. : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
16.
Design for manufacturability through design-process integration : 28 February-2 March 2007, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2007.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
17.
Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA
Published
Bellingham, Wash., USA : SPIE, ©2002.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
18.
Design, characterization, and packaging for MEMS and microelectronics II : 17-19 December, 2001, Adelaide, Australia
Published
Bellingham, Wash. : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
19.
Advanced optical manufacturing and testing : 9-11 July 1990, San Diego, California
Published
Bellingham, Wash., USA : SPIE, ©1990.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
20.
Stray radiation V : 18-20 August 1986, San Diego, California
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1987.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
21.
Micromachining and microfabrication process technology and devices : 7-9 November 2001, Nanjing, China
Published
Bellingham, Wash., USA : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
22.
Micromachining and microfabrication process technology V : 20-22 September, 1999, Santa Clara, California
Published
Bellingham, Wash. : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
23.
Optical design and engineering : 30 September-3 October 2003, St. Etienne, France
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
24.
Laser micromachining for optoelectronic device fabrication : 30 October 2002, Brugge, Belgium
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
25.
Optoelectronic interconnects and packaging IV : 12-14 February, 1997, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online