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Anomaly Detection and Imaging with X-Rays (ADIX) : 19-20 April 2016, Baltimore, Maryland, United States
Author
Anomaly Detection and Imaging with X-Rays (ADIX) (1st : 2016 : Baltimore, Maryland, United States),
Title
Anomaly Detection and Imaging with X-Rays (ADIX) : 19-20 April 2016, Baltimore, Maryland, United States / Amit Ashok, Mark A. Neifeld, Michael E. Gehm, editors ; sponsored and published by SPIE.
ISBN
9781510600881
1510600884
Publication
Bellingham, Washington : SPIE, [2016].
Copyright Notice Date
©2016
Physical Description
1 online resource : illustrations (some color).
Local Notes
Access is available to the Yale community.
Notes
"The inaugural SPIE Anomaly Detection and Imaging with X-Rays (ADIX) conference."--Introduction.
Access and use
Access restricted by licensing agreement.
Variant and related titles
ADIX
SPIE digital library.
Other formats
Print version:
Format
Books
/
Online
Language
English
Added to Catalog
November 28, 2017
Series
Proceedings of SPIE--the International Society for Optical Engineering ; v. 9847.
Proceedings of SPIE, volume 9847
Proceedings of SPIE (electronic), volume 9847
Bibliography
Includes bibliographical references.
Subjects
X-rays
>
Congresses.
X-rays
>
Technological innovations
>
Congresses.
Imaging systems
>
Congresses.
Imaging systems
>
Technological innovations
>
Congresses.
Also listed under
Ashok, Amit, editor
Neifeld, Mark A., editor
Gehm, Michael Eric, 1969- editor
SPIE (Society), issuing body, sponsoring body
Bookmark As
https://search.library.yale.edu/catalog/13370352
Citation
Cite
Available from:
Online
Online book
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