Anomaly Detection and Imaging with X-Rays (ADIX) : 19-20 April 2016, Baltimore, Maryland, United States / Amit Ashok, Mark A. Neifeld, Michael E. Gehm, editors ; sponsored and published by SPIE.

Bellingham, Washington : SPIE, [2016].

©2016

1 online resource : illustrations (some color).

Access is available to the Yale community.

"The inaugural SPIE Anomaly Detection and Imaging with X-Rays (ADIX) conference."--Introduction.

Access restricted by licensing agreement.

Print version:

Books / Online

English

November 28, 2017

Includes bibliographical references.