Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California / Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by National Institute of Standards and Technology (USA) [and others] ; cooperating organizations, Institute of Acostic Microscopy (USA) [and others] ; published by SPIE--the International Society for Optical Engineering.

Bellingham, Wash. : SPIE, ©2003.

1 online resource (ix, 276 pages) : illustrations

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Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.

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English

October 30, 2023

Includes bibliographical references and author index.

Conference papers and proceedings.