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Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA
Title
Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA / M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering.
ISBN
0819449733
9780819449733
Published
Bellingham, Wash. : SPIE, ©2003.
Physical Description
1 online resource (xxi, 516 pages) : illustrations
Local Notes
Access is available to the Yale community.
Notes
Electronic reproduction. Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 2003. Mode of access: World Wide Web. Access restricted to SPIE Digital Library subscribers.
English.
Access and use
Access restricted by licensing agreement.
Variant and related titles
SPIE digital library. OCLC KB.
Other formats
Also available in print.
Original
Format
Books / Online
Language
English
Added to Catalog
October 30, 2023
Series
Proceedings / SPIE--the International Society for Optical Engineering ; v. 5113
Bibliography
Includes bibliographical references and author index.
Subjects
Genre/Form
Conference papers and proceedings
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