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Integrated circuits

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Online Results (52)
1.
Advanced techniques for integrated circuit processing
Published
Bellingham, Wash., USA : SPIE, [1991-1993]
©1991-©1993
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
2.
In-line characterization techniques for performance and yield enhancement in microelectronic manufacturing : 1-2 October 1997, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
3.
Manufacturing process control for microelectronic devices and circuits : 20-21 October 1994, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1994.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
4.
In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
5.
Optical characterization techniques for high-performance microelectronic device manufacturing III : 16-17 October 1996, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
6.
Microelectronics manufacturability, yield, and reliability : 20-21 October 1994, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, ©1994.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
7.
Microelectronics manufacturing and reliability : 21-22 September 1992, San Jose, California
Published
Bellingham, Wash. : SPIE, ©1993.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
8.
Laser processing of semiconductors and hybrids : 21-22 January 1986, Los Angeles, California
Published
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1986.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
9.
Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, ©1994.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
10.
Modeling aspects in optical metrology III : 23-24 May 2011, Munich, Germany
Published
Bellingham, Wash. : SPIE, ©2011.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
11.
Lithography for semiconductor manufacturing : 19-21 May 1999, Edinburgh, Scotland
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
12.
Design for manufacturability through design-process integration V : 2-3 March 2011, San Jose, California, United States
Published
Bellingham, Wash. : SPIE, ©2011.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
13.
Design for manufacturability through design-process integration IV : 24-25 February 2010, San Jose, California, United States
Published
Bellingham, Wash. : SPIE, ©2010.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
14.
Design and process integration for microelectronic manufacturing IV : 23-24 February, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2006.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
15.
Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA
Published
Bellingham, Wash. : SPIE, ©2005.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
16.
Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2004.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
17.
Design and process integration for microelectronic manufacturing II : 26-28 February 2003, Santa Clara, California, USA
Published
Bellingham, Wash. : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
18.
In-line methods and monitors for process and yield improvement : 22-23 September 1999, Santa Clara, California
Published
Bellingham, Wash., USA : SPIE, ©1999.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
19.
Integrated circuit design : power and timing modeling, optimization and simulation : 12th International Workshop, PATMOS 2002, Seville, Spain, September 11-13, 2002 : proceedings
Author
PATMOS 2002 (2002 : Seville, Spain)
Published
Berlin ; New York : Springer, ©2002.
Location
Library Shelving Facility (LSF) >> QA76 A1 L43 2451 (LC)
Format
Books
20.
Process and materials characterization and diagnostics in IC manufacturing : 27-28 February 2003, Santa Clara, California, USA
Published
Bellingham, Wash., USA : SPIE, ©2003.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
21.
In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK
Published
Bellingham, Wash. : SPIE, ©2001.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
22.
Process, equipment, and materials control in integrated circuit manufacturing III : 1-2 October 1997, Austin, Texas
Published
Bellingham, Washington : SPIE, ©1997.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
23.
Process, equipment, and materials control in integrated circuit manufacturing II : 16-17 October 1996, Austin, Texas
Published
Bellingham, Wash., USA : SPIE, ©1996.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
24.
Optical characterization techniques for high-performance microelectronic device manufacturing II : 25-26 October 1995, Austin, Texas
Published
Bellingham, Wash. : SPIE, ©1995.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online
25.
International Conference of Microelectronics--Microelectronics '92 : 21-23 September 1992, Warsaw, Poland
Author
International Conference of Microelectronics (1992 : Warsaw, Poland)
Published
Bellingham, Wash. : The Society, ©1992.
Online
Online book
Location
Yale Internet Resource >> None
Format
Books / Online